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Top ＞ Products(Solar cell)
| ■Wafer Inspection System WIS-2010C | ||||
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This system can inspect the thickness measurement (Bow/Warp), resistance measurement, microcrack inspection and surface / backside inspection. System throughput is 1 second/wafer. ⇒ Products deteil
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| ■Module ＥＬ Inspection System MEI | ||||
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This system can inspect the crack inspection, electric short-circuit inspection and scratch inspection. The thermal inspection unit by the wiring short circuit can be installed with the option. ⇒ Products deteil
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| ■Solar Cell Transportation TR-1000L | ||||
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This system supplies one piece of wafer per one second, and transports the stacked wafer. ⇒ Products deteil
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