RayResearch Corporation|Semiconductor Inspection System | Solar Cell Inspection System

Module EL Inspection System MEI

This system can inspect the crack inspection, electric short-circuit inspection and scratch inspection. The thermal inspection unit by the wiring short circuit can be installed with the option. This system supports in-line method or off-line method.

Module type	Crystal / Thin film module
Module size	125mm square / 156mm square The module supports up to 72 series
nspection item	・Crack inspection ・Electric short-circuit inspection ・Scratch inspection ・Thermal inspection by the wiring short circuit (Option)
Dimension	4300(W)×2700(D)×3000(H)　mm