RayResearch Corporation|Semiconductor Inspection System | Solar Cell Inspection System

Wafer Thickness Measuring System

This system is the wafer thickness measuring system with transfer function and thickness measuring function. It is possible to measure the thickness of each point in the specified wafer. 6 inch and 8 inch are supported.

Equipped with transfer function and thickness measurement function.

Compatible with 6-inch and 8-inch wafers.

Up to 2000 points can be measured. * Thickness measurement point can be set arbitrarily.

Equipped with real-time monitoring function for acquired data.