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Top Company Profile History
@@Business Description History Company Profile
History

Month / Year
History
Aug. 2000 RayResearch Corporation established in Gunma with JPY 10,000,000 initial capital
Sep. 2000 Developed Wafer Bevel Scratched Inspection System
Nov. 2000 Developed Wafer Sorter TR100
Jul. 2001 Developed Wafer Backside Scratches Inspection System
Developed Inspection System Coordinate Transformation software
Sep. 2001 Developed Wafer Sorter TR100F
Apr. 2002 Developed Mold System Imade Processing
Jun. 2002 Developed Wafer Backside Inspection System
Jan. 2003 Developed Wafer Backside Scratches Inspection Unit (High-speed type)
Sep. 2003 Headquarters moved
Developed Wafer Surface/Backside Scratches Inspection Unit
Oct. 2003 Developed Sensitive Wafer Backside Scratches Inspection Unit
Apr. 2004 Developed Wafer Sorter
May. 2005 Developed Wafer Thickness Measuring System
Developed Wafer Edge Scratches Inspection System
Jun. 2005 Developed Wafer Backside Scratches / Crystal Defect Inspection Unit
Sep. 2005 Developed Wafer Crystal Defect Inspection Unit
Nov. 2005 Developed Sensitive Wafer Crystal Defects Inspection Unit (High-speed type)
Jan. 2006 Developed Infrared Ray Defects Detection System
Oct. 2006 Developed QR-code Reader System
Mar. 2007 Developed Infrared Ray Defects Detection System (With transportation machine)
Apr. 2007 Headquarters moved
Jun. 2007 Developed FT-IR Measuring System
Nov. 2007 Infinity Corporation and merger
Dec. 2007 Developed Wafer Sorter TR100RS(For thin wafer)
Developed Wafer Sorter TR100-mini
Feb. 2008 Developed FOUP Opener FO-300
Apr. 2008 Developed Wafer Carrier Distortion Tester ASI-10
Nov. 2008 Developed Wafer Inspection System WIS-5155
Jul. 2009 Developed Module EL Inspection System MEI (Stand-alone type)
Mar. 2010 Developed Wafer Inspection System WIS-2010C
Apr. 2010 Developed Module EL Inspection System MEI (In-line type)