| Month / Year |
History |
| Aug. 2000 |
RayResearch Corporation established in Gunma with JPY 10,000,000 initial capital |
| Sep. 2000 |
Developed Wafer Bevel Scratched Inspection System |
| Nov. 2000 |
Developed Wafer Sorter TR100 |
| Jul. 2001 |
Developed Wafer Backside Scratches Inspection System
Developed Inspection System Coordinate Transformation software |
| Sep. 2001 |
Developed Wafer Sorter TR100F |
| Apr. 2002 |
Developed Mold System Imade Processing |
| Jun. 2002 |
Developed Wafer Backside Inspection System |
| Jan. 2003 |
Developed Wafer Backside Scratches Inspection Unit (High-speed type) |
| Sep. 2003 |
Headquarters moved
Developed Wafer Surface/Backside Scratches Inspection Unit |
| Oct. 2003 |
Developed Sensitive Wafer Backside Scratches Inspection Unit |
| Apr. 2004 |
Developed Wafer Sorter |
| May. 2005 |
Developed Wafer Thickness Measuring System
Developed Wafer Edge Scratches Inspection System |
| Jun. 2005 |
Developed Wafer Backside Scratches / Crystal Defect Inspection Unit |
| Sep. 2005 |
Developed Wafer Crystal Defect Inspection Unit |
| Nov. 2005 |
Developed Sensitive Wafer Crystal Defects Inspection Unit (High-speed type) |
| Jan. 2006 |
Developed Infrared Ray Defects Detection System |
| Oct. 2006 |
Developed QR-code Reader System |
| Mar. 2007 |
Developed Infrared Ray Defects Detection System (With transportation machine) |
| Apr. 2007 |
Headquarters moved |
| Jun. 2007 |
Developed FT-IR Measuring System |
| Nov. 2007 |
Infinity Corporation and merger |
| Dec. 2007 |
Developed Wafer Sorter TR100RS(For thin wafer)
Developed Wafer Sorter TR100-mini |
| Feb. 2008 |
Developed FOUP Opener FO-300 |
| Apr. 2008 |
Developed Wafer Carrier Distortion Tester ASI-10 |
| Nov. 2008 |
Developed Wafer Inspection System WIS-5155 |
| Jul. 2009 |
Developed Module EL Inspection System MEI (Stand-alone type) |
| Mar. 2010 |
Developed Wafer Inspection System WIS-2010C |
| Apr. 2010 |
Developed Module EL Inspection System MEI (In-line type) |
| Feb. 2011 |
Developed Module Cell Inspection System MEI (Manual type) |
| Mar. 2011 |
Developed Inline Wafer Inspection System WIS-2011C/WIS2011M |
| Jul. 2011 |
Developed EL / Simple Module Inspection Unit |
| Sep. 2011 |
Developed Wafer Transfer Machine SWT100 |
| Dec. 2011 |
Developed IR Inspection Unit IRI300 |
| Jun. 2012 |
Developed Wafer Mapping Unit MP3-25 |
| Jan. 2013 |
Developed Wafer Sorter SR100S |
| Mar. 2013 |
Developed Visual Inspection System MPI-600 |
| Nov. 2013 |
Developed Wafer Sorter TR100T |
| Sep. 2014 |
Developed Polishing Surface Plate Scratch Detection System KTI-15J
Developed Wafer Thickness Measuring System TR100WT |
| Oct. 2014 |
Developed Gap discrimination sensor GPS4M |
| Feb. 2015 |
Developed Transfer System (For FT-IR Measuring System) FT-IR1200 |
| Jun. 2015 |
Developed Chip Washer System |
| Feb. 2016 |
Developed Φ300 EFEM for mercury prober CV300 |
| Mar. 2016 |
Developed Wafer Automatic Appearance Inspection System |
| May. 2016 |
Developed IR Inspection System (P ++ Support) IRI300 |
| Aug. 2016 |
Developed 8 Inch Surface Automatic Inspection System SLI-200 |
| May. 2017 |
Developed Wafer Handling Machine For FT-IR300 |
| Jun. 2017 |
Headquarters moved |
| Dec. 2018 |
Developed Wafer Transfer System (For FT-IR) FT-IR1200T |
| Jan. 2019 |
Developed Wafer Transfer System (For FT-IR) Inline Support FT-IR1200Inline |
